institute instrumentation center
Institute Instrumentation Center has been established with an aim to provide high end research facilities to faculty/students/research scholars of the institute. The analytical facilities of IIC are also extended to the students, researchers and faculty members of other Institutes and Organizations of the country as well. Collaboration with Industries on R & D and Consultancy Projects are also welcome by the Institute.
Institute Instrumentation Centre aims to -
- Provide facilities for characterization, high- resolution imaging and precision chemical analysis of different kinds of materials.
- Dissipate knowledge and experience in the above through short-term courses/seminar/workshops etc.
SIGMA 500VP Field
Emission Scanning Electron Microscope with EDS and EBSD
PAnalytical Empyrean XRD
X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, texture and residual stress investigations.
With the 3rd generation Empyrean, Malvern Panalytical has now redefined the concept of a multipurpose diffractometer: MultiCore Optics enable the largest variety of measurements without any manual intervention. Empyrean has the unique ability to measure all sample types - from powders to thin films, from nanomaterials to solid objects - on a single instrument. The world of materials science is constantly changing and the life of a high performance diffractometer is much longer than the typical horizon of any research project. With Empyrean, you are ready for anything the future holds.
Get the best data for your publications with Empyrean; train and inspire your students. Acquisition of comprehensive information about a material is the key for successful research. Empyrean will give you the highest data quality, letting you see the finest details of your precious samples by performing non-destructive, cutting-edge characterization studies
Energy storage/ batteries
Get a better understanding of your battery materials. Analysis of battery material using X-ray diffraction provides component phase purity and the crystallite size of anode and cathode compounds. Empyrean equipped with the GaliPIX3D detector also allows in situ and in operando measurements of long-lasting cells using hard X-radiation.
Accomplish advanced characterization of your pharmaceuticals. X-ray powder diffraction, a rapid non-destructive analytical technique, is widely applied in drug discovery, formulation, stability testing and final product quality control. The proven and comprehensive method is available with 21 CFR Part 11 Audit Trail support. Empyrean can also perform in situ non- ambient analysis without manual intervention and high-throughput measurements on well-plates.
Assess crystal structure or structure-property relationship in crystalline and semi-crystalline compounds. Specialty chemicals, also referred to as effect or performance chemicals, are often custom-manufactured materials with unique properties or performance effects to materials or formulation. Empyrean can be used for a detailed phase identification and understanding of these valuable compounds.
Reveal the smallest traces of evidence. The use of non-destructive analytical instrumentation plays a key role in today’s forensic laboratories where full chain of custody and data control is desired across all stages of the process. Empyrean can provide information that is vital in criminal investigations and forensic science.
Determine retained austenite, stress and texture during metal production. Process control and quality control in the metal industry - whether it concerns primary metals or special products - need rapid and accurate chemical analysis as well as microstructural characterization of metals and alloys. Empyrean can take care of these needs.
Reveal dimensions and structures in all types of nanomaterials. X-ray scattering and diffraction are powerful and versatile nanometrology tools for the determination of nanoscale dimensions, shapes and structures, as well as the analysis of crystalline phases and local atomic structures. Empyrean delivers most accurate scattering data.
Thin film metrology
Get access to critical parameters of thin films ranging from ultra-thin single layers to complex multilayer stacks. X-ray diffraction and X-ray reflectivity can provide non-destructive, reliable and accurate data for the characterization of thin films. Empyrean enables the determination of ultra-fast reciprocal space maps, X-ray reflectivity and rocking curve analysis.
XRD ANALYSIS SOFTWARE-HighScore:
Comprehensive crystallographic analysis
HighScore with the Plus option contains four classical indexing routines (Ito, Dicvol, Treor or McMaille). The unit cell refinement includes zero offset or sample displacement. The space group test is performed on either the full profile (Le Bail fit) or on indexed peaks. A Pawley fit to refine lattice parameters is another possibility.
Lattice and structure transformations as well as cell reductions are supported. An automatic standardization of non-standard space group settings is possible while loading such structure data.
The symmetry explorer tool contains the crystal symmetry, point- and Laue group, reflection conditions and special positions of all 230 standard space groups. Additional data covers the about 150 non-standard space groups used in the ICSD structure database.
Automatic classification or cluster analysis
HighScore with the Plus option makes large volume data processing fast and easy.
Cluster analysis automatically sorts all scans of an experiment into closely related clusters and marks the most representative scan of each cluster, as well as outliers. This is useful for non-ambient experiments, mining samples and soil mapping, high-throughput screening campaigns and for monitoring the uniformity of industrial products.
A principal components analysis (PCA) helps to visualize the mathematically determined clusters. It shows confidence areas around each cluster.
The visual comparison of all scans in a cluster is possible as well as the distribution of clusters (on a measuring grid, on a well plate) is shown.
With the 3D structure plotting functionality, you can choose the colors of atoms, polyhedral viewing, and shift, turn, roll and zoom the structure in order to obtain the best view.
HighScore with the Plus option supports the charge flipping algorithm and difference Fourier plots for determination of the crystal structure from powder diffraction data.
HighScore with the Plus option has many advantages for Rietveld refinements.
Automatic strategies and batches support the novice user to perform quantitative phase analysis, including the determination of an amorphous component. The refinement control displays a complete picture of all parameters, limits and constraints involved.
Range checking and automatic or manual constraints ensure the stability and reproducibility of the refinements. No parameter turn-on sequence is required, the proprietary solver takes care of this.
Three profile functions including a true Voigt function are supported, which is especially important for crystallite size-microstrain determinations. Le Bail fits are possible and hkl-phase fits support the inclusion of unknown structure phases. The 'superflip' algorithm by L. Palatinus is included to solve crystal structures from high-quality powder data.
Charges for FESEM and XRD
Emission Scanning Electron Microscope (FESEM) Proforma
Powder XRD Proforma