X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analyzing a wide range of materials, including fluids, metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. Example areas of application include qualitative and quantitative phase analysis, crystallography, structure and relaxation determination, texture and residual stress investigations.
With the 3rd generation Empyrean, Malvern Panalytical has now redefined the concept of a multipurpose diffractometer: MultiCore Optics enable the largest variety of measurements without any manual intervention. Empyrean has the unique ability to measure all sample types - from powders to thin films, from nanomaterials to solid objects - on a single instrument. The world of materials science is constantly changing and the life of a high performance diffractometer is much longer than the typical horizon of any research project. With Empyrean, you are ready for anything the future holds.
Key Applications:
Academia Get the best data for your publications with Empyrean; train and inspire your students. Acquisition of comprehensive information about a material is the key for successful research. Empyrean will give you the highest data quality, letting you see the finest details of your precious samples by performing non-destructive, cutting-edge characterization studies
Energy storage/ batteries Get a better understanding of your battery materials. Analysis of battery material using X-ray diffraction provides component phase purity and the crystallite size of anode and cathode compounds. Empyrean equipped with the GaliPIX3D detector also allows in situ and in operando measurements of long-lasting cells using hard X-radiation.
Pharmaceuticals Accomplish advanced characterization of your pharmaceuticals. X-ray powder diffraction, a rapid non-destructive analytical technique, is widely applied in drug discovery, formulation, stability testing and final product quality control. The proven and comprehensive method is available with 21 CFR Part 11 Audit Trail support. Empyrean can also perform in situ non- ambient analysis without manual intervention and high-throughput measurements on well-plates.
Specialty chemicals Assess crystal structure or structure-property relationship in crystalline and semi-crystalline compounds. Specialty chemicals, also referred to as effect or performance chemicals, are often custom-manufactured materials with unique properties or performance effects to materials or formulation. Empyrean can be used for a detailed phase identification and understanding of these valuable compounds.
Forensics Reveal the smallest traces of evidence. The use of non-destructive analytical instrumentation plays a key role in today’s forensic laboratories where full chain of custody and data control is desired across all stages of the process. Empyrean can provide information that is vital in criminal investigations and forensic science.
Metals Determine retained austenite, stress and texture during metal production. Process control and quality control in the metal industry - whether it concerns primary metals or special products - need rapid and accurate chemical analysis as well as microstructural characterization of metals and alloys. Empyrean can take care of these needs.
Nanomaterials Reveal dimensions and structures in all types of nanomaterials. X-ray scattering and diffraction are powerful and versatile nanometrology tools for the determination of nanoscale dimensions, shapes and structures, as well as the analysis of crystalline phases and local atomic structures. Empyrean delivers most accurate scattering data.
Thin film metrology Get access to critical parameters of thin films ranging from ultra-thin single layers to complex multilayer stacks. X-ray diffraction and X-ray reflectivity can provide non-destructive, reliable and accurate data for the characterization of thin films. Empyrean enables the determination of ultra-fast reciprocal space maps, X-ray reflectivity and rocking curve analysis.