Yesterday, Dr Dilip Kumar Bisoyi from NIT Rourkela delivered an informative and mesmerizing talk at the Department of Physics on the topic: "Characterization of materials at nano scale order length- A SAXS Application". He discussed the basic phenomena and the application of small angle scattering techniques for the characterization of nanoscale materials which need very sophisticated tools to study their properties. He informed us about the use of intensity of scattering over imaging based techniques for the characterization of the materials and study their properties indirectly. The faculty members, research scholars and MSc. students participated in the talk.